Convert VtsHalNfcV1_*TargetTest to be parameterized test
Bug: 142397658
Test: atest
Change-Id: Id8fdc7128ead21d734f0dfa8b9428de9724b490c
diff --git a/nfc/1.1/vts/functional/Android.bp b/nfc/1.1/vts/functional/Android.bp
index 6698c5a..8da0ce3 100644
--- a/nfc/1.1/vts/functional/Android.bp
+++ b/nfc/1.1/vts/functional/Android.bp
@@ -22,5 +22,5 @@
"android.hardware.nfc@1.0",
"android.hardware.nfc@1.1",
],
- test_suites: ["general-tests"],
+ test_suites: ["general-tests", "vts-core"],
}
diff --git a/nfc/1.1/vts/functional/VtsHalNfcV1_1TargetTest.cpp b/nfc/1.1/vts/functional/VtsHalNfcV1_1TargetTest.cpp
index 0b7c88b..13537e4 100644
--- a/nfc/1.1/vts/functional/VtsHalNfcV1_1TargetTest.cpp
+++ b/nfc/1.1/vts/functional/VtsHalNfcV1_1TargetTest.cpp
@@ -21,11 +21,12 @@
#include <android/hardware/nfc/1.1/INfc.h>
#include <android/hardware/nfc/1.1/INfcClientCallback.h>
#include <android/hardware/nfc/1.1/types.h>
+#include <gtest/gtest.h>
#include <hardware/nfc.h>
+#include <hidl/GtestPrinter.h>
+#include <hidl/ServiceManagement.h>
#include <VtsHalHidlTargetCallbackBase.h>
-#include <VtsHalHidlTargetTestBase.h>
-#include <VtsHalHidlTargetTestEnvBase.h>
using ::android::hardware::nfc::V1_1::INfc;
using ::android::hardware::nfc::V1_1::INfcClientCallback;
@@ -83,25 +84,11 @@
};
};
-// Test environment for Nfc HIDL HAL.
-class NfcHidlEnvironment : public ::testing::VtsHalHidlTargetTestEnvBase {
- public:
- // get the test environment singleton
- static NfcHidlEnvironment* Instance() {
- static NfcHidlEnvironment* instance = new NfcHidlEnvironment;
- return instance;
- }
-
- virtual void registerTestServices() override { registerTestService<INfc>(); }
- private:
- NfcHidlEnvironment() {}
-};
-
// The main test class for NFC HIDL HAL.
-class NfcHidlTest : public ::testing::VtsHalHidlTargetTestBase {
+class NfcHidlTest : public ::testing::TestWithParam<std::string> {
public:
virtual void SetUp() override {
- nfc_ = ::testing::VtsHalHidlTargetTestBase::getService<INfc>();
+ nfc_ = INfc::getService(GetParam());
ASSERT_NE(nfc_, nullptr);
nfc_cb_ = new NfcClientCallback();
@@ -151,7 +138,7 @@
* calls factoryReset()
* checks status
*/
-TEST_F(NfcHidlTest, FactoryReset) {
+TEST_P(NfcHidlTest, FactoryReset) {
nfc_->factoryReset();
EXPECT_EQ(NfcStatus::OK, nfc_->close());
@@ -174,7 +161,7 @@
* Makes an open call, waits for NfcEvent.OPEN_CPLT
* Immediately calls closeforPowerOffCase() and waits for NfcEvent.CLOSE_CPLT
*/
-TEST_F(NfcHidlTest, OpenAndCloseForPowerOff) {
+TEST_P(NfcHidlTest, OpenAndCloseForPowerOff) {
EXPECT_EQ(NfcStatus::OK, nfc_->closeForPowerOffCase());
// Wait for CLOSE_CPLT event
auto res = nfc_cb_->WaitForCallback(kCallbackNameSendEvent);
@@ -195,7 +182,7 @@
* Calls closeForPowerOffCase()
* Calls close() - checks failed status
*/
-TEST_F(NfcHidlTest, CloseForPowerCaseOffAfterClose) {
+TEST_P(NfcHidlTest, CloseForPowerCaseOffAfterClose) {
EXPECT_EQ(NfcStatus::OK, nfc_->closeForPowerOffCase());
// Wait for CLOSE_CPLT event
auto res = nfc_cb_->WaitForCallback(kCallbackNameSendEvent);
@@ -218,16 +205,19 @@
* Calls getConfig()
* checks if fields in NfcConfig are populated correctly
*/
-TEST_F(NfcHidlTest, GetConfig) {
+TEST_P(NfcHidlTest, GetConfig) {
nfc_->getConfig([](NfcConfig config) {
EXPECT_GE(config.maxIsoDepTransceiveLength, MIN_ISO_DEP_TRANSCEIVE_LENGTH);
});
}
+INSTANTIATE_TEST_SUITE_P(
+ PerInstance, NfcHidlTest,
+ testing::ValuesIn(android::hardware::getAllHalInstanceNames(INfc::descriptor)),
+ android::hardware::PrintInstanceNameToString);
+
int main(int argc, char** argv) {
- ::testing::AddGlobalTestEnvironment(NfcHidlEnvironment::Instance());
::testing::InitGoogleTest(&argc, argv);
- NfcHidlEnvironment::Instance()->init(&argc, argv);
std::system("svc nfc disable"); /* Turn off NFC */
sleep(5);