Merge "Extend test timeout value from 180s to 600s" am: 276369a3df am: 29a6aa191d am: d29699d4ac

Original change: https://android-review.googlesource.com/c/platform/hardware/interfaces/+/1525581

MUST ONLY BE SUBMITTED BY AUTOMERGER

Change-Id: I93390349556f833b6cb7ecb03f7f1c68ac48f0ec
diff --git a/nfc/1.0/vts/functional/AndroidTest.xml b/nfc/1.0/vts/functional/AndroidTest.xml
index 364672b..76aca48 100644
--- a/nfc/1.0/vts/functional/AndroidTest.xml
+++ b/nfc/1.0/vts/functional/AndroidTest.xml
@@ -28,6 +28,6 @@
     <test class="com.android.tradefed.testtype.GTest" >
         <option name="native-test-device-path" value="/data/local/tmp" />
         <option name="module-name" value="VtsHalNfcV1_0TargetTest" />
-        <option name="native-test-timeout" value="180000"/>
+        <option name="native-test-timeout" value="600000"/>
     </test>
 </configuration>