commit | c3de1caf4327dc367a95f7416cba19827428bd1b | [log] [tgz] |
---|---|---|
author | David Drysdale <drysdale@google.com> | Tue May 09 08:10:36 2023 +0100 |
committer | David Drysdale <drysdale@google.com> | Tue Jul 04 13:23:04 2023 +0100 |
tree | 2e567a11ef401eb971b1735e0f352348d4fb6e47 | |
parent | e959d0923dfc3786c4fd44e49a578d8b12223cea [diff] [blame] |
Skip ATTEST_KEY using variant on waivered devices Bug: 281452355 Bug: 289451966 Test: VtsAidlKeyMintTargetTest Change-Id: Id448edae88569518deb2db4ab7bf50d16f33709a
diff --git a/security/keymint/aidl/vts/functional/KeyMintAidlTestBase.h b/security/keymint/aidl/vts/functional/KeyMintAidlTestBase.h index 5d32268..8934a57 100644 --- a/security/keymint/aidl/vts/functional/KeyMintAidlTestBase.h +++ b/security/keymint/aidl/vts/functional/KeyMintAidlTestBase.h
@@ -370,6 +370,7 @@ bool is_attest_key_feature_disabled(void) const; bool is_strongbox_enabled(void) const; bool is_chipset_allowed_km4_strongbox(void) const; + bool shouldSkipAttestKeyTest(void) const; void skipAttestKeyTest(void) const; protected: