| commit | 69431a4f683e8bd0b696979c27eee4fadc54fa9c | [log] [tgz] |
|---|---|---|
| author | Keun Soo Yim <yim@google.com> | Tue Nov 22 08:58:18 2016 -0800 |
| committer | Keun Soo Yim <yim@google.com> | Tue Nov 22 08:58:18 2016 -0800 |
| tree | df07132128ab8f5c7a5647d1301ced97dd21a103 | |
| parent | b74aac81074405dbccfc8bfc20bdc33b3eff2409 [diff] |
increase the thermal hal timeout to 5m Test: vts-tradefed; run vts-hal-hidl Change-Id: I66e36d24a8a55b2b61797b8cadc18b5891d5a051
diff --git a/thermal/1.0/vts/functional/vts/testcases/hal/thermal/hidl/target/AndroidTest.xml b/thermal/1.0/vts/functional/vts/testcases/hal/thermal/hidl/target/AndroidTest.xml index cc159b9..169264d 100644 --- a/thermal/1.0/vts/functional/vts/testcases/hal/thermal/hidl/target/AndroidTest.xml +++ b/thermal/1.0/vts/functional/vts/testcases/hal/thermal/hidl/target/AndroidTest.xml
@@ -25,7 +25,7 @@ _64bit::DATA/nativetest64/thermal_hidl_hal_test/thermal_hidl_hal_test, "/> <option name="binary-test-type" value="gtest" /> - <option name="test-timeout" value="1m" /> + <option name="test-timeout" value="5m" /> </test> </configuration>
diff --git a/thermal/1.0/vts/functional/vts/testcases/hal/thermal/hidl/target_profiling/AndroidTest.xml b/thermal/1.0/vts/functional/vts/testcases/hal/thermal/hidl/target_profiling/AndroidTest.xml index 038dfe2..3790c56 100644 --- a/thermal/1.0/vts/functional/vts/testcases/hal/thermal/hidl/target_profiling/AndroidTest.xml +++ b/thermal/1.0/vts/functional/vts/testcases/hal/thermal/hidl/target_profiling/AndroidTest.xml
@@ -26,7 +26,7 @@ "/> <option name="test-config-path" value="vts/testcases/hal/thermal/hidl/target_profiling/ThermalHidlTargetProfilingTest.config" /> <option name="binary-test-type" value="gtest" /> - <option name="test-timeout" value="1m" /> + <option name="test-timeout" value="5m" /> </test> </configuration>