commit | 68ae05dd2d9eb563887b0f3208ab8d41f9f47e14 | [log] [tgz] |
---|---|---|
author | Keun Soo YIM <yim@google.com> | Tue Nov 27 14:04:42 2018 -0800 |
committer | Keun Soo YIM <yim@google.com> | Fri Dec 07 10:49:56 2018 -0800 |
tree | 104f96d2f8ebbf8767d57b9f35850784dd16487c | |
parent | 60d34da5f0527f677d04a76409977d5064601fec [diff] [blame] |
pack VTS cc_test binaries as general-tests Test: make general-tests Bug: 120093339 Merged-In: I363450d205868f900e4925ccff1430e2a569f2a4 Change-Id: I363450d205868f900e4925ccff1430e2a569f2a4
diff --git a/secure_element/1.0/vts/functional/Android.bp b/secure_element/1.0/vts/functional/Android.bp index 752df9e..2b2b73e 100644 --- a/secure_element/1.0/vts/functional/Android.bp +++ b/secure_element/1.0/vts/functional/Android.bp
@@ -21,4 +21,5 @@ static_libs: [ "android.hardware.secure_element@1.0", ], + test_suites: ["general-tests"], }