| commit | 6525f4554299aa31fb283af0721fd91e0c14d145 | [log] [tgz] |
|---|---|---|
| author | Keun Soo Yim <yim@google.com> | Thu Jan 12 23:19:20 2017 +0000 |
| committer | android-build-merger <android-build-merger@google.com> | Thu Jan 12 23:19:20 2017 +0000 |
| tree | afec19c737072cde16c0213dec4ecfb72349c5f5 | |
| parent | 8959e955f85a958670955a4333259518621ae649 [diff] | |
| parent | 4fbf78481e3b732b8dd89102c018f62cb83c6d2e [diff] |
increase the timeouts to 10mins for nfc target-side tests am: 4fbf78481e Change-Id: I4a5d2cb71fe5db5a7f68a025dc86735c6a699751
diff --git a/nfc/1.0/vts/functional/vts/testcases/hal/nfc/hidl/target/AndroidTest.xml b/nfc/1.0/vts/functional/vts/testcases/hal/nfc/hidl/target/AndroidTest.xml index f692011..ee02488 100644 --- a/nfc/1.0/vts/functional/vts/testcases/hal/nfc/hidl/target/AndroidTest.xml +++ b/nfc/1.0/vts/functional/vts/testcases/hal/nfc/hidl/target/AndroidTest.xml
@@ -26,6 +26,6 @@ "/> <option name="test-config-path" value="vts/testcases/hal/nfc/hidl/target/HalNfcHidlTargetBasicTest.config" /> <option name="binary-test-type" value="gtest" /> - <option name="test-timeout" value="1m" /> + <option name="test-timeout" value="10m" /> </test> </configuration>
diff --git a/nfc/1.0/vts/functional/vts/testcases/hal/nfc/hidl/target_profiling/AndroidTest.xml b/nfc/1.0/vts/functional/vts/testcases/hal/nfc/hidl/target_profiling/AndroidTest.xml index 11aa88f..da6cf22 100644 --- a/nfc/1.0/vts/functional/vts/testcases/hal/nfc/hidl/target_profiling/AndroidTest.xml +++ b/nfc/1.0/vts/functional/vts/testcases/hal/nfc/hidl/target_profiling/AndroidTest.xml
@@ -25,7 +25,7 @@ _64bit::DATA/nativetest64/nfc_hidl_hal_test/nfc_hidl_hal_test, "/> <option name="binary-test-type" value="gtest" /> - <option name="test-timeout" value="1m" /> + <option name="test-timeout" value="10m" /> <option name="enable-profiling" value="true" /> </test> </configuration>