| commit | 54abf5632a445ea1477dead989dc5ad61a5e8550 | [log] [tgz] |
|---|---|---|
| author | Zhuoyao Zhang <zhuoyao@google.com> | Wed Jan 25 15:44:45 2017 -0800 |
| committer | Zhuoyao Zhang <zhuoyao@google.com> | Wed Jan 25 15:57:06 2017 -0800 |
| tree | ca41531a36999040e45e83184f7a75a533c0129c | |
| parent | 688a9e14859283651d90769e665c2d0198295988 [diff] |
Increase the timeout for NfcHidlTargetProfilingTest. * Given there's still test failue due to timeout: https://android-vts-internal.googleplex.com/show_table?testName=NfcHidlTargetProfilingTest, increased the limit to 25m. Test: run vts -m NfcHidlTargetProfilingTest Change-Id: Ie5fee6a399281ec538e6724207916908bb8da4d0
diff --git a/nfc/1.0/vts/functional/vts/testcases/hal/nfc/hidl/target_profiling/AndroidTest.xml b/nfc/1.0/vts/functional/vts/testcases/hal/nfc/hidl/target_profiling/AndroidTest.xml index 42c7e22..3b570f9 100644 --- a/nfc/1.0/vts/functional/vts/testcases/hal/nfc/hidl/target_profiling/AndroidTest.xml +++ b/nfc/1.0/vts/functional/vts/testcases/hal/nfc/hidl/target_profiling/AndroidTest.xml
@@ -25,7 +25,7 @@ _64bit::DATA/nativetest64/nfc_hidl_hal_test/nfc_hidl_hal_test, "/> <option name="binary-test-type" value="gtest" /> - <option name="test-timeout" value="20m" /> + <option name="test-timeout" value="25m" /> <option name="enable-profiling" value="true" /> </test> </configuration>