| commit | 4fbf78481e3b732b8dd89102c018f62cb83c6d2e | [log] [tgz] |
|---|---|---|
| author | Keun Soo Yim <yim@google.com> | Wed Nov 30 13:46:00 2016 -0800 |
| committer | Ruchi Kandoi <kandoiruchi@google.com> | Thu Jan 12 11:02:22 2017 -0800 |
| tree | 6cf36a7db3bde32c50ba95cced6cb38509d6f401 | |
| parent | 12b532c8f35a5d6e59596168cb6438e65fa1d29d [diff] |
increase the timeouts to 10mins for nfc target-side tests Test: local direct binary runs (1.5mins on average) Change-Id: Id85633a6a4a55a9d6876142447521146cd6e57f3 (cherry picked from commit c0299961175114568c044485155662fbffc98fd0)
diff --git a/nfc/1.0/vts/functional/vts/testcases/hal/nfc/hidl/target/AndroidTest.xml b/nfc/1.0/vts/functional/vts/testcases/hal/nfc/hidl/target/AndroidTest.xml index f692011..ee02488 100644 --- a/nfc/1.0/vts/functional/vts/testcases/hal/nfc/hidl/target/AndroidTest.xml +++ b/nfc/1.0/vts/functional/vts/testcases/hal/nfc/hidl/target/AndroidTest.xml
@@ -26,6 +26,6 @@ "/> <option name="test-config-path" value="vts/testcases/hal/nfc/hidl/target/HalNfcHidlTargetBasicTest.config" /> <option name="binary-test-type" value="gtest" /> - <option name="test-timeout" value="1m" /> + <option name="test-timeout" value="10m" /> </test> </configuration>
diff --git a/nfc/1.0/vts/functional/vts/testcases/hal/nfc/hidl/target_profiling/AndroidTest.xml b/nfc/1.0/vts/functional/vts/testcases/hal/nfc/hidl/target_profiling/AndroidTest.xml index 11aa88f..da6cf22 100644 --- a/nfc/1.0/vts/functional/vts/testcases/hal/nfc/hidl/target_profiling/AndroidTest.xml +++ b/nfc/1.0/vts/functional/vts/testcases/hal/nfc/hidl/target_profiling/AndroidTest.xml
@@ -25,7 +25,7 @@ _64bit::DATA/nativetest64/nfc_hidl_hal_test/nfc_hidl_hal_test, "/> <option name="binary-test-type" value="gtest" /> - <option name="test-timeout" value="1m" /> + <option name="test-timeout" value="10m" /> <option name="enable-profiling" value="true" /> </test> </configuration>