Merge "NFC: Update VTS test"
diff --git a/ir/1.0/vts/functional/ir_hidl_hal_test.cpp b/ir/1.0/vts/functional/ir_hidl_hal_test.cpp
index 57d0b73..08c7974 100644
--- a/ir/1.0/vts/functional/ir_hidl_hal_test.cpp
+++ b/ir/1.0/vts/functional/ir_hidl_hal_test.cpp
@@ -34,7 +34,7 @@
 class ConsumerIrHidlTest : public ::testing::Test {
  public:
   virtual void SetUp() override {
-    ir = IConsumerIr::getService(false);
+    ir = IConsumerIr::getService();
     ASSERT_NE(ir, nullptr);
   }
 
diff --git a/ir/1.0/vts/functional/vts/testcases/hal/ir/hidl/target/AndroidTest.xml b/ir/1.0/vts/functional/vts/testcases/hal/ir/hidl/target/AndroidTest.xml
index 3ad7e45..bf3d236 100644
--- a/ir/1.0/vts/functional/vts/testcases/hal/ir/hidl/target/AndroidTest.xml
+++ b/ir/1.0/vts/functional/vts/testcases/hal/ir/hidl/target/AndroidTest.xml
@@ -25,7 +25,7 @@
             _64bit::DATA/nativetest64/ir_hidl_hal_test/ir_hidl_hal_test,
             "/>
         <option name="binary-test-type" value="hal_hidl_gtest" />
-        <option name="hwbinder-service" value="android.hardware.ir" />
+        <option name="precondition-hwbinder-service" value="android.hardware.ir" />
         <option name="test-timeout" value="1m" />
     </test>
 </configuration>