uwb(vts): Close HAL at end of each test
Bug: 235558748
Test: atest VtsHalUwbTargetTest
Change-Id: I5361baab1f9204052e0f625b3c17242fbfe66190
diff --git a/uwb/aidl/vts/VtsHalUwbTargetTest.cpp b/uwb/aidl/vts/VtsHalUwbTargetTest.cpp
index edd8dd6..81d26ba 100644
--- a/uwb/aidl/vts/VtsHalUwbTargetTest.cpp
+++ b/uwb/aidl/vts/VtsHalUwbTargetTest.cpp
@@ -68,6 +68,11 @@
iuwb_ = IUwb::fromBinder(SpAIBinder(AServiceManager_waitForService(GetParam().c_str())));
ASSERT_NE(iuwb_, nullptr);
}
+ virtual void TearDown() override {
+ // Trigger HAL close at end of each test.
+ const auto iuwb_chip = getAnyChip();
+ iuwb_chip->close();
+ }
std::shared_ptr<IUwb> iuwb_;
// TODO (b/197638976): We pick the first chip here. Need to fix this