commit | 25a866eecc75058be54a837fe5c00df496e626ca | [log] [tgz] |
---|---|---|
author | Siarhei Vishniakou <svv@google.com> | Mon Mar 30 17:17:21 2020 -0700 |
committer | Siarhei Vishniakou <svv@google.com> | Mon Mar 30 17:23:11 2020 -0700 |
tree | 2f4b912a74ee063c09938ad078a065b480aeed7b | |
parent | 55a25b2d47a9b72ba2eb02f26c742d9f57a4fcfb [diff] [blame] |
Convert InputClassifierTest to parametrized test The test is currently based on old vts harness and not in vts suite. Bug: 150383004 Test: atest VtsHalInputClassifierV1_0TargetTest Change-Id: I5df4eff845fd49b8663d1589c5314d5acf4b5057
diff --git a/input/classifier/1.0/vts/functional/Android.bp b/input/classifier/1.0/vts/functional/Android.bp index ef49d70..4db1398 100644 --- a/input/classifier/1.0/vts/functional/Android.bp +++ b/input/classifier/1.0/vts/functional/Android.bp
@@ -22,6 +22,8 @@ "android.hardware.input.classifier@1.0", "android.hardware.input.common@1.0", ], - test_suites: ["general-tests"], + test_suites: [ + "general-tests", + "vts-core", + ], } -