change all vts hidl tests to use VtsHalHidlTargetBaseTest
Bug: 33385836
Test: mma
Change-Id: I660d6e0fce6422d87d4b227273a77c95d20ed3f2
diff --git a/nfc/1.0/vts/functional/VtsHalNfcV1_0TargetTest.cpp b/nfc/1.0/vts/functional/VtsHalNfcV1_0TargetTest.cpp
index a0c5f1a..ae21f9a 100644
--- a/nfc/1.0/vts/functional/VtsHalNfcV1_0TargetTest.cpp
+++ b/nfc/1.0/vts/functional/VtsHalNfcV1_0TargetTest.cpp
@@ -22,7 +22,7 @@
#include <android/hardware/nfc/1.0/types.h>
#include <hardware/nfc.h>
-#include <gtest/gtest.h>
+#include <VtsHalHidlTargetBaseTest.h>
#include <chrono>
#include <condition_variable>
#include <mutex>
@@ -56,10 +56,10 @@
#define TIMEOUT_PERIOD 5
// The main test class for NFC HIDL HAL.
-class NfcHidlTest : public ::testing::Test {
+class NfcHidlTest : public ::testing::VtsHalHidlTargetBaseTest {
public:
virtual void SetUp() override {
- nfc_ = INfc::getService();
+ nfc_ = testing::VtsHalHidlTargetBaseTest::getService<INfc>();
ASSERT_NE(nfc_, nullptr);
nfc_cb_ = new NfcClientCallback(*this);