| commit | 0a51242abcf658f84d62bb97ccdfb4f623c03326 | [log] [tgz] |
|---|---|---|
| author | Siarhei Vishniakou <svv@google.com> | Mon Mar 30 17:17:21 2020 -0700 |
| committer | Siarhei Vishniakou <svv@google.com> | Tue Mar 31 06:18:34 2020 +0000 |
| tree | 85d3b14476942ad3644a07fd312272abce978033 | |
| parent | fa8e5f931a2ddf663a14d6caf1b2c16a40348c6b [diff] [blame] |
Convert InputClassifierTest to parametrized test The test is currently based on old vts harness and not in vts suite. Bug: 150383004 Test: atest VtsHalInputClassifierV1_0TargetTest Change-Id: I5df4eff845fd49b8663d1589c5314d5acf4b5057 Merged-In: I5df4eff845fd49b8663d1589c5314d5acf4b5057 (cherry picked from commit 25a866eecc75058be54a837fe5c00df496e626ca)
diff --git a/input/classifier/1.0/vts/functional/Android.bp b/input/classifier/1.0/vts/functional/Android.bp index ef49d70..4db1398 100644 --- a/input/classifier/1.0/vts/functional/Android.bp +++ b/input/classifier/1.0/vts/functional/Android.bp
@@ -22,6 +22,8 @@ "android.hardware.input.classifier@1.0", "android.hardware.input.common@1.0", ], - test_suites: ["general-tests"], + test_suites: [ + "general-tests", + "vts-core", + ], } -